Title :
Testing passive UHF tag performance evolution
Author :
Daniel G. Kuester;David R. Novotny;Jeffrey R. Guerrieri;Zoya Popović
Author_Institution :
U.S. Department of Commerce, National Institute of Standards and Technology, Boulder, CO, USA 80304
Abstract :
Trends in tag development since the introduction of the ISO 18000-6C and EPC Global standards are investigated empirically with measurements of power harvesting and backscattering performance from 20 samples of passive tags across 860-960 MHz. The population spans ages of 0 to 6 years, 9 tag manufacturers, and 3 chip manufacturers. All tags were still in working condition, except two 5-year-old tags that no longer responded to interrogations and a 3-year-old tag with a degraded chip-to-antenna bond. Despite steadily improving chips, some older tags show performance comparable to new tags.
Keywords :
"Antenna measurements","Power measurement","Backscatter","Modulation","ISO standards","Receiving antennas"
Conference_Titel :
RFID-Technologies and Applications (RFID-TA), 2011 IEEE International Conference on
Print_ISBN :
978-1-4577-0028-6
DOI :
10.1109/RFID-TA.2011.6068600
