DocumentCode :
3647001
Title :
MEMS reliability
Author :
I. Stanimirović;Z. Stanimirović
Author_Institution :
IRITEL A.D. Belgrade, Batajnič
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
173
Lastpage :
175
Abstract :
Over the last few years MEMS technology has demonstrated high potential for realizing essential components for modern engineering systems. However, our knowledge of reliability issues relevant to MEMS growing is still insufficient. This paper provides a brief overview of MEMS technologies and generic structures as well as failure mechanisms that are commonly encountered.
Keywords :
"Micromechanical devices","Reliability","Packaging","Substrates","Surface treatment","Stress"
Publisher :
ieee
Conference_Titel :
Microelectronics (MIEL), 2012 28th International Conference on
ISSN :
pending
Print_ISBN :
978-1-4673-0237-1
Type :
conf
DOI :
10.1109/MIEL.2012.6222826
Filename :
6222826
Link To Document :
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