DocumentCode :
3651730
Title :
Memristor measurements and simulations
Author :
Milan Fratrik;Stefan Badura;Martin Klimo;Ondrej Skvarek
Author_Institution :
Fac. of Manage. Sci. &
Volume :
2
fYear :
2013
Firstpage :
243
Lastpage :
246
Abstract :
Memristors may find their use in many applications - mainly as memory or logic and also as fuzzy systems or neuromorphic systems. High amount of scientific papers show that the research of memristors draws a lot of attention recently. Memristor models are briefly described in this paper and we present our results obtained from measurements. The goal of our experiments and measurements was to fit the theoretical models with real memristors. In this paper we discuss our achievements and we present deep analysis of described problem.
Keywords :
"Mathematical model","Memristors","Current measurement","Voltage measurement","Semiconductor device measurement","Integrated circuit modeling","Equations"
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2013 International
ISSN :
1545-827X
Print_ISBN :
978-1-4673-5670-1
Type :
conf
DOI :
10.1109/SMICND.2013.6688668
Filename :
6688668
Link To Document :
بازگشت