DocumentCode :
3662070
Title :
An improved analytical IGBT model for loss calculation including junction temperature and stray inductance
Author :
Yunyu Tang; Hao Ma
Author_Institution :
College of Electrical Engineering, Zhejiang University, Hangzhou, China, 310027
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
227
Lastpage :
232
Abstract :
An improved analytical model suitable for IGBT modules is proposed in this paper to calculate the power losses with high accuracy and short calculation time. In this model, the parameters varying with junction temperature of the modules, such as di/dt in the turn-on period and dv/dt in the turn-off period, are discussed and derived according to several equivalent models. In addition, the parasitic inductance in the circuit including the emitter and collector inductance in the power circuits and the gate inductance in the driving loop are considered in this model. Based on this proposed model, the simulation switching waveforms of collector currents and collector-emitter voltages are provided to verify the model. Meanwhile, the calculated power losses are confirmed to be precise by comparing with measurement results.
Keywords :
"Junctions","Insulated gate bipolar transistors","Integrated circuit modeling","Analytical models","Inductance","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Industrial Electronics (ISIE), 2015 IEEE 24th International Symposium on
Electronic_ISBN :
2163-5145
Type :
conf
DOI :
10.1109/ISIE.2015.7281473
Filename :
7281473
Link To Document :
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