Title :
Performance assessment of VeSFET-based SRAM
Author :
Ping-Lin Yang;Malgorzata Marek-Sadowska;Wojciech Maly
Author_Institution :
Department of Electrical and Computer Engineering, University of California, Santa Barbara, Santa Barbara, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
Power wall has become one of the main bottlenecks of future VLSI designs. A recently proposed junctionless twin-gate Vertical Slit Field Effect Transistor (VeSFET) is a low power and thermal friendly device, with highly regular layout, and two-side accessibility. These properties are critical for advanced 2D/3D technologies. SRAMs are fundamental blocks of VLSI systems, which are usually used for technology evaluation. This paper provides a VeSFET SRAM performance assessment modeled by CACTI, a cache modeling tool. The results show that VeSFET SRAM design is speed competitive to CMOS SRAM with about 40% of dynamic read energy consumption and 35% of total power consumption for read access rate 100MHz.
Keywords :
"Conferences","Electron devices","Solid state circuits"
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
DOI :
10.1109/EDSSC.2015.7285054