DocumentCode :
3667190
Title :
Simulation of shot noise measurement experiments in graphene
Author :
P. Marconcini;M. Macucci
Author_Institution :
Dipartimento di Ingegneria dell´Informazione, Università
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
4
Abstract :
We have adopted an approximate technique for the determination of the potential landscape and an envelope-function based transport calculation to simulate the shot noise properties, in the presence of potential disorder, of a graphene constriction biased through lateral split gates. Our numerical results are in good qualitative agreement with the measurements recently performed by A. Mostovov and D. C. Glattli on this structure, which show a dependence of the Fano factor on the gate bias, with a maximum around the Dirac point.
Keywords :
"Graphene","Noise","Logic gates","Electric potential","Noise measurement","Voltage measurement","Capacitance"
Publisher :
ieee
Conference_Titel :
Noise and Fluctuations (ICNF), 2015 International Conference on
Type :
conf
DOI :
10.1109/ICNF.2015.7288602
Filename :
7288602
Link To Document :
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