• DocumentCode
    3667385
  • Title

    Application of OMEMS technology in trapped ion quantum computing

  • Author

    Stephen Crain;Emily Mount;So-Young Baek;Jungsang Kim;Peter Maunz

  • Author_Institution
    Fitzpatrick Institute for Photonics, Electrical and Computer Engineering Department, Duke University, Durham, North Carolina 27708, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Scalability is one of the main challenges of trapped ion based quantum computation, partly limited by the ability to manipulate the increasing number of quantum bits (qubits). For individual addressing of qubits, microelectromechanical systems (MEMS) technology allows one to design movable micromirrors to focus laser beams on individual ions and steer the focal point in two dimensions. This system is able to scale to multiple beams, has switching speeds comparable to typical single qubit gate times, and has negligible crosstalk on neighboring ions.
  • Keywords
    "Switches","Charge carrier processes","Optics"
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2015 International Conference on
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4673-6834-6
  • Electronic_ISBN
    2160-5041
  • Type

    conf

  • DOI
    10.1109/OMN.2015.7288890
  • Filename
    7288890