DocumentCode
3667928
Title
Impact of S/D tunneling in ultrascaled devices, a Multi-Subband Ensemble Monte Carlo study
Author
C. Medina-Bailon;C. Sampedro;F. Gamiz;A. Godoy;L. Donetti
Author_Institution
Nanoelectronics Research Group, Universidad de Granada, 18071, Spain
fYear
2015
Firstpage
214
Lastpage
217
Abstract
Because of the scaling of electronic devices, quantum effects play an important role on their characteristics which are becoming more and more dominant as transistors approach to nanometer scales. Therefore, the inclusion of these effects in advanced device simulators will be mandatory to predict the behavior of future transistors targeting sub-10nm nodes. This work implements Source-to-Drain Tunneling mechanisms (S/D tunneling) in Multi-Subband Ensemble Monte Carlo (MS-EMC) simulators showing the importance of quantum transport effects and the possibility of being implemented in a reliable way on advanced device simulators.
Keywords
Tunneling
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
ISSN
1946-1569
Print_ISBN
978-1-4673-7858-1
Type
conf
DOI
10.1109/SISPAD.2015.7292297
Filename
7292297
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