• DocumentCode
    3667928
  • Title

    Impact of S/D tunneling in ultrascaled devices, a Multi-Subband Ensemble Monte Carlo study

  • Author

    C. Medina-Bailon;C. Sampedro;F. Gamiz;A. Godoy;L. Donetti

  • Author_Institution
    Nanoelectronics Research Group, Universidad de Granada, 18071, Spain
  • fYear
    2015
  • Firstpage
    214
  • Lastpage
    217
  • Abstract
    Because of the scaling of electronic devices, quantum effects play an important role on their characteristics which are becoming more and more dominant as transistors approach to nanometer scales. Therefore, the inclusion of these effects in advanced device simulators will be mandatory to predict the behavior of future transistors targeting sub-10nm nodes. This work implements Source-to-Drain Tunneling mechanisms (S/D tunneling) in Multi-Subband Ensemble Monte Carlo (MS-EMC) simulators showing the importance of quantum transport effects and the possibility of being implemented in a reliable way on advanced device simulators.
  • Keywords
    Tunneling
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4673-7858-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.2015.7292297
  • Filename
    7292297