• DocumentCode
    3667930
  • Title

    Modeling and tackling resistivity scaling in metal nanowires

  • Author

    Kristof Moors;Bart Sorée;Wim Magnus

  • Author_Institution
    imec, Kapeldreef 75, B-3001 Leuven, Belgium
  • fYear
    2015
  • Firstpage
    222
  • Lastpage
    225
  • Abstract
    A self-consistent analytical solution of the multi-subband Boltzmann transport equation with collision term describing grain boundary and surface roughness scattering is presented to study the resistivity scaling in metal nanowires. The different scattering mechanisms and the influence of their statistical parameters are analyzed. Instead of a simple power law relating the height or width of a nanowire to its resistivity, the picture appears to be more complicated due to quantum-mechanical scattering and quantization effects, especially for surface roughness scattering.
  • Keywords
    "Conductivity","Scattering","Nanowires","Wires","Metals","Approximation methods","Distribution functions"
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4673-7858-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.2015.7292299
  • Filename
    7292299