DocumentCode :
3668411
Title :
Injection inhomogeneity and lasing thershold in III-nitride multi-QW deep-UV laser diodes
Author :
Mikhail V. Kisin;Denis V. Mamedov;Chih-Li Chuang;Hussein S. El-Ghoroury
Author_Institution :
Ostendo Technologies Inc. Carlsbad, CA, USA
fYear :
2015
Firstpage :
25
Lastpage :
26
Abstract :
Lasing threshold conditions have been analyzed in deep-UV (DUV) multiple-QW (MQW) III-nitride laser diode (LD) structures with different QW confinement depth. Shallow QWs with smaller internal polarization fields reveal better QW emission characteristics including lower QW transparency population and higher differential gain. In MQW LD structures, however, the high-gain operation of shallow QWs is hindered by insufficient QW injection due to increased carrier leakage from shallow-QW active region. Deep active QWs can attain higher operational populations and provide for higher LD optical gain; however, LDs designed with deeper active QWs suffer from MQW population non-uniformity due to increased inhomogeneity of carrier injection. Underpumped deep QWs reduce the total modal gain of the LD structure thus deteriorating the lasing threshold and LD power conversion (wall-plug) efficiency.
Keywords :
"Quantum well devices","Sociology","Statistics","Aluminum","Nonhomogeneous media","Optical polarization","Lasers"
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
ISSN :
2158-3234
Print_ISBN :
978-1-4799-8378-0
Type :
conf
DOI :
10.1109/NUSOD.2015.7292804
Filename :
7292804
Link To Document :
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