Noise and variation-aware modeling and characterization of integrated circuits using network representations

Noise-aware Design, statistical modeling analysis and experimental verification of crystal oscillators fabricated using advanced SiGe-C BiCMOS technology are presented. The concept of Broadband stochastic equivalent circuit models extraction is introduced to properly account for variability and sensitivity of critical design parameters (e.g., Process, Power Supply, Temperature, Geometry). Engineering solutions referenced as Built-In-Self-Test (BIST) are proposed for controlled variability and sensitivity within specified design performance margins.