• DocumentCode
    3672265
  • Title

    New insights into Laplacian similarity search

  • Author

    Xiao-Ming Wu;Zhenguo Li;Shih-Fu Chang

  • Author_Institution
    Department of Electrical Engineering, Columbia University, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1949
  • Lastpage
    1957
  • Abstract
    Graph-based computer vision applications rely critically on similarity metrics which compute the pairwise similarity between any pair of vertices on graphs. This paper investigates the fundamental design of commonly used similarity metrics, and provides new insights to guide their use in practice. In particular, we introduce a family of similarity metrics in the form of (L + αΛ)-1, where L is the graph Laplacian, Λ is a positive diagonal matrix acting as a regularizer, and α is a positive balancing factor. Such metrics respect graph topology when a is small, and reproduce well-known metrics such as hitting times and the pseudo-inverse of graph Laplacian with different regularizer Λ. This paper is the first to analyze the important impact of selecting Λ in retrieving the local cluster from a seed. We find that different Λ can lead to surprisingly complementary behaviors: Λ = D (degree matrix) can reliably extract the cluster of a query if it is sparser than surrounding clusters, while Λ = I (identity matrix) is preferred if it is denser than surrounding clusters. Since in practice there is no reliable way to determine the local density in order to select the right model, we propose a new design of Λ that automatically adapts to the local density. Experiments on image retrieval verify our theoretical arguments and confirm the benefit of the proposed metric. We expect the insights of our theory to provide guidelines for more applications in computer vision and other domains.
  • Keywords
    "Measurement","Laplace equations","Robustness","Image retrieval","Symmetric matrices","Topology","Harmonic analysis"
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2015.7298805
  • Filename
    7298805