• DocumentCode
    3672932
  • Title

    Electrically testable CMOS image pixel circuit

  • Author

    Masaki Hashizume;Shingo Saijo;Hiroyuki Yotsuyanng

  • Author_Institution
    Institute of Technology and Science, Tokushima University, Tokushima, 770-8506 Japan
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A CMOS image pixel circuit is proposed which is able to be tested by an electrical test method in this paper. The image pixel circuit is tested as an analog circuit without irradiating light to it. A CMOS image sensor is designed to evaluate testability of the pixel circuit. It is shown by SPICE simulation whether 89% of open defects inserted in the image pixel circuit are detected by the electrical test method.
  • Keywords
    "CMOS image sensors","CMOS integrated circuits","Generators","Voltage measurement","Layout","Semiconductor device modeling"
  • Publisher
    ieee
  • Conference_Titel
    Circuit Theory and Design (ECCTD), 2015 European Conference on
  • Type

    conf

  • DOI
    10.1109/ECCTD.2015.7300000
  • Filename
    7300000
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3672932