Title :
Reliability schemes for nano-communications
Author :
Valeriu Beiu;Leonard Dăuş
Author_Institution :
College of IT, UAE University, Al Ain, UAE
Abstract :
In this paper we consider consecutive systems as a possible match for certain nano-technologies, as communicating at the nanoscale will need very reliable schemes (for achieving low transmission bit error rates). In fact, nano-technologies like, e.g., molecular, nano-fluidic, nano-magnetic (and even FinFETs), might be used for mapping consecutive systems. We shall start by mentioning previous results for 1D consecutive systems, before focusing on 2D ones. After introducing 2D consecutive systems, the paper will present bounds for estimating their reliability. Simulation results for particular 2D consecutive cases will show that some of the bounds are in fact exact. Finally, comparisons of classical and consecutive schemes will show their advantages, and will be followed by conclusions and future directions of research.
Keywords :
"Upper bound","Redundancy","Reliability theory","Integrated circuit reliability","Reliability engineering","Accuracy"
Conference_Titel :
Circuit Theory and Design (ECCTD), 2015 European Conference on
DOI :
10.1109/ECCTD.2015.7300038