Automated analysis of the effects induced by radio-frequency pulses on embedded systems for EMC Functional Safety

Many studies were devoted to the test (M. G. Bäckström and K. G. Lövstrand, IEEE Transaction on EMC, 46, 3, 2004, pp. 396-403) and the analysis (Y. V. Parfenov, W. A. Radasky, B. A. Titov et al., In Proc. of the URSI General Assembly, China, 2014) of effects induced by intentional electromagnetics interferences on electronic systems. One of the main limitations encountered during the testing of devices remains the detection of short or temporary failures as it generally requires a manual analysis of the system.