Tracking of characteristic modes through far-field pattern correlation

Recent developments in characteristic mode (CM) analysis enable a more systematic approach to designing multi-antennas for mobile terminals. However, some of the advantages of developing antennas through CMs are based on accurate mode tracking over frequency. Existing tracking methods are primarily based on the tracking of eigencurrents over frequency, by which mode swapping and degenerate modes can occur. To solve these problems, a completely different method of tracking CM by means of far-field pattern correlation was recently developed and shown to work well for perfect electric conductors (PECs). This paper reveals that the same method can also substantially reduce tracking errors for structures with both PEC and dielectric materials, relative to state-of-the-art methods.