Title :
Carrier lifetime assessment in integrated Ge waveguide devices
Author :
S. A. Srinivasan;M. Pantouvaki;P. Verheyen;G. Lepaee;P. Absil;J. Van Campenhout;D. Van ThouAout
Author_Institution :
Imec, Kapeldreef 75, Heverlee B-3001, Belgium
Abstract :
Carrier lifetimes in Ge waveguides on Si are deduced from time-resolved pump-probe spectroscopy. For a 1 μm wide Ge waveguide, a lifetime of 1.6 ns is estimated for a carrier density of around 2×1019cm-3.
Conference_Titel :
Group IV Photonics (GFP), 2015 IEEE 12th International Conference on
DOI :
10.1109/Group4.2015.7305916
