DocumentCode :
3678424
Title :
Programmer-Guided Reliability for Extreme-Scale Applications
Author :
David E. Bernholdt;Wael R. Elwasif;Christos Kartsaklis;Seyong Lee;Tiffany M. Mintz
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
fYear :
2015
Firstpage :
571
Lastpage :
579
Abstract :
We present "programmer-guided reliability" (PGR) as a systematic conceptual approach to address the expected rise in soft errors in coming extreme-scale systems at the application level. The approach involves instrumentation of the application with code to detect data corruption errors. The location and nature of these error detectors are at the discretion of the programmer, who uses their knowledge and experience with the problem domain, the application, the solution algorithms, etc., to determine the most vulnerable areas of the code and the most appropriate ways to detect data corruption. To illustrate the approach, we provide examples of error detectors from four different benchmark-scale applications. We also describe a simple control framework that allows for runtime configuration of the error detectors without recompilation of the application, as well as dynamic reconfiguration during the execution of the application. Finally, we discuss a number of future directions building on the basic PGR approach, including the incorporation of some general error detectors into the programming environment in order to make them more easily usable by the programmer.
Keywords :
"Detectors","Data structures","Reliability","Instruments","Fault tolerant systems","Kernel"
Publisher :
ieee
Conference_Titel :
Cluster Computing (CLUSTER), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/CLUSTER.2015.105
Filename :
7307654
Link To Document :
بازگشت