• DocumentCode
    3678426
  • Title

    Stay Alive, Don´t Give Up: DUE and SDC Reduction with Memory Repair

  • Author

    Dong Wan Kim;Mattan Erez

  • Author_Institution
    Electr. &
  • fYear
    2015
  • Firstpage
    588
  • Lastpage
    594
  • Abstract
    Memory faults are the most common fault in current systems. Strong memory error protection techniques prevent most memory faults from immediately affecting applications and the system, but come at a high and possibly increasing cost as system size increases and fabrication technology continues to scale. To effectively protect against memory faults and errors, a combination of online error-checking and correcting codes are used in conjunction with module replacement. This paper makes two contributions. First, we study the magnitude of the silent data corruption problem when faulty modules are replaced in a timely manner. Second, we show that currently rarely-used fine-grained repair mechanisms drastically reduce both the module replacement rate and the risk of silent data corruption in large systems.
  • Keywords
    "Random access memory","Maintenance engineering","Error correction codes","Retirement","Circuit faults","Reliability","Performance evaluation"
  • Publisher
    ieee
  • Conference_Titel
    Cluster Computing (CLUSTER), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/CLUSTER.2015.107
  • Filename
    7307656