DocumentCode :
3680841
Title :
Solid-state power converter repeatability analysis
Author :
Anthony Dal Gobbo;Davide Aguglia
Author_Institution :
CERN-European Organization for Nuclear Research, Technology Department, Electrical Power Converter group 1211 Geneva 23, Switzerland
fYear :
2015
Firstpage :
1
Lastpage :
7
Abstract :
This paper presents a method for evaluating power converter repeatability. The focus is on solid-state switch mode power converter for which the most problematic non-repeatability sources are the jitter of the drivers and of the switches leading to output voltage pulses bad repeatability. Both driver and switch turn-on and turn-off delay dispersion have been measured. These measurements confirm that the delay is Gaussian distributed and that the repeatability prediction method is valid.
Keywords :
"Jitter","Switches","Voltage measurement","Insulated gate bipolar transistors","Delays","Pulse measurements","Semiconductor device measurement"
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
Type :
conf
DOI :
10.1109/EPE.2015.7311694
Filename :
7311694
Link To Document :
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