• DocumentCode
    3682279
  • Title

    μRNG: A 300–950mV 323Gbps/W all-digital full-entropy true random number generator in 14nm FinFET CMOS

  • Author

    Sanu Mathew;David Johnston;Paul Newman;Sudhir Satpathy;Vikram Suresh;Mark Anders;Himanshu Kaul;Gregory Chen;Amit Agarwal;Steven Hsu;Ram Krishnamurthy

  • Author_Institution
    Circuits Research Lab, Intel Corporation, Hillsboro, OR 97124
  • fYear
    2015
  • Firstpage
    116
  • Lastpage
    119
  • Abstract
    An all-digital full-entropy True Random Number Generator (TRNG) with measured 1.3GHz operation and total power consumption of 1.5mW at 0.75V, 25oC is fabricated in 14nm FinFET CMOS. Three independent self-calibrating entropy sources, coupled with pre-extraction correlation suppressors and a real-time BIW extractor enable ultra-low energy consumption of 3pJ/bit, while generating cryptographic-quality keys with measured Shannon entropy up to 0.99999999995 and lower-bound min-entropy >0.99. The 100% digital design enables a compact layout occupying 1088μm2, with scalable operation down to 300mV, while passing all NIST statistical randomness tests.
  • Keywords
    "Entropy","Voltage measurement","CMOS integrated circuits","Power measurement","Correlation","Generators","Cryptography"
  • Publisher
    ieee
  • Conference_Titel
    European Solid-State Circuits Conference (ESSCIRC), ESSCIRC 2015 - 41st
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4673-7470-5
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2015.7313842
  • Filename
    7313842