• DocumentCode
    3683155
  • Title

    [Title page]

  • fYear
    2015
  • Abstract
    The following topics are dealt with: ESD protection in advanced technologies; factory control; system level ESD design; ESD checking and verification; ESD failure case study; TCAD design and simulation; tester and testing method; 3D chip stacking ESD protection; ESD simulation; HV ESD clamp design; system level ESD testing; and failure analysis.
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314793
  • Filename
    7314793