DocumentCode :
3683155
Title :
[Title page]
fYear :
2015
Abstract :
The following topics are dealt with: ESD protection in advanced technologies; factory control; system level ESD design; ESD checking and verification; ESD failure case study; TCAD design and simulation; tester and testing method; 3D chip stacking ESD protection; ESD simulation; HV ESD clamp design; system level ESD testing; and failure analysis.
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type :
conf
DOI :
10.1109/EOSESD.2015.7314793
Filename :
7314793
Link To Document :
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