DocumentCode
3683155
Title
[Title page]
fYear
2015
Abstract
The following topics are dealt with: ESD protection in advanced technologies; factory control; system level ESD design; ESD checking and verification; ESD failure case study; TCAD design and simulation; tester and testing method; 3D chip stacking ESD protection; ESD simulation; HV ESD clamp design; system level ESD testing; and failure analysis.
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type
conf
DOI
10.1109/EOSESD.2015.7314793
Filename
7314793
Link To Document