• DocumentCode
    3683166
  • Title

    Debug and prediction of EOS events using long duration Transmission Line Pulse (TLP) measurements

  • Author

    Dave Clarke;Stephen Heffernan

  • Author_Institution
    Analog Devices Intl, Raheen Business Park, Limerick, Ireland
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This case study demonstrates how long-duration Transmission Line Pulse (TLP) measurements can be used to debug, replicate and even predict EOS events. Knowing the EOS waveform characteristics allows easier determination of the root cause of the electrical overstress. This is critical in preventing future such occurrences.
  • Keywords
    "Thyristors","Earth Observing System","Electrostatic discharges","Power supplies","Rails","Stress","Metals"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314804
  • Filename
    7314804
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683166