Title :
InGaAsP/InP QW impurity free intermixing for variable ZrO2 cap thickness
Author :
Sona Das;Dharmander Malik;Tathagata Bhowmick;Utpal Das;Tushar D. Das
Author_Institution :
Department of Electrical Engineering, Indian Institute of Technology, Kanpur, 208016, India
Abstract :
Impurity Free Quantum Well Intermixing (IFQWI) by cap layer thickness variation for InGaAsP/InP multiquantum wells (MQWs) is reported for the first time. The blue-shift is observed to be enhanced or inhibited depending on the thickness of the ZrO2 cap layer used (100-600nm) for anneal conditions of 600-750°C for 40s. The group-V intermixing in InGaAsP/InP dominates the IFQWI resulting in a blue-shift of the MQW band gap and the blue-shift increases with increasing ZrO2 thickness to 400nm. A 600nm ZrO2 cap is found to inhibit the blue-shift. For higher anneal temperatures similar inhibition nature is observed, with larger blue-shifts. An inter-diffusion model shows that the diffusion length ratio for Group-V to Group-III initially increases from 1.25-1.6 for 100-400nm ZrO2 thickness, but decreases to 1.1 for 600nm ZrO2. This technique is promising for the fabrication of tapered waveguides for photonic integration of InGaAsP/InP by IFQWI.
Keywords :
"Indium phosphide","III-V semiconductor materials","Annealing","Indexes","Doping","Substrates","Quantum well devices"
Conference_Titel :
Photonics Conference (IPC), 2015
DOI :
10.1109/IPCon.2015.7323708