DocumentCode :
3688280
Title :
Impacts of tapered sidewall profiles with high aspect ratio on subwavelength grating structure
Author :
W. X. Yu;D. C. Wu;Y. Yi
Author_Institution :
Integrated nano optoelectronics laboratory, University of Michigan, United States of America
fYear :
2015
Firstpage :
166
Lastpage :
167
Abstract :
We have numerically demonstrated the significant impacts on the resonance mode characteristics of subwavelength grating structures due to tapered sidewall profile and high aspect ratio, which is normally obtained from CMOS-compatible nanoelectronic fabrication processes.
Keywords :
"Gratings","Photonics"
Publisher :
ieee
Conference_Titel :
Photonics Conference (IPC), 2015
ISSN :
1092-8081
Type :
conf
DOI :
10.1109/IPCon.2015.7323730
Filename :
7323730
Link To Document :
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