DocumentCode
3689017
Title
Vertical field effect transistor with sub-15nm gate-all-around on Si nanowire array
Author
G. Larrieu;Y. Guerfi;X.L Han;N. Clément
Author_Institution
LAAS CNRS 7 Avenue colonel Roche, 31077 Toulouse, France
fYear
2015
Firstpage
202
Lastpage
205
Abstract
A vertical MOS architecture implemented on Si nanowire (NW) array with a scaled Gate-All-Around (14nm) and symmetrical diffusive S/D contacts is presented with noteworthy demonstrations both in processing (layer engineering at nanoscale), in electrical properties (high electrostatic control, low defect level, multi-Vt platform) in the fabrication of CMOS inverters and in the perspective of ultimate scaling.
Keywords
Decision support systems
Publisher
ieee
Conference_Titel
Solid State Device Research Conference (ESSDERC), 2015 45th European
ISSN
1930-8876
Print_ISBN
978-1-4673-7133-9
Electronic_ISBN
2378-6558
Type
conf
DOI
10.1109/ESSDERC.2015.7324750
Filename
7324750
Link To Document