DocumentCode :
3690020
Title :
A new variational method for pan-sharpening
Author :
Pengfei Liu;Liang Xiao;Songze Tang
Author_Institution :
School of Computer Science and Engineering, Nanjing University of Science and Technology, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
597
Lastpage :
600
Abstract :
In this paper, we present a new variational method for pan-sharpening, which aims to obtain a high resolution multi-spectral (MS) image from a low resolution MS image and a high resolution panchromatic (PAN) image. Firstly, we assume that the desired high resolution MS image after down-sampling should be close to the low resolution MS image. More specifically, the intensity maps of PAN image and high resolution MS image bands are treated as three-dimensional (3D) differential surfaces. Then, we constrain that the surfaces of PAN image and high resolution MS image band should have the same bending directions at each point in 3D space. Based on these assumptions, a variational model is proposed and an efficient algorithm is designed to solve this variational model. Experimental results demonstrate that the proposed method outperforms various pan-sharpening methods in terms of both excellent spatial and spectral qualities.
Keywords :
"Spatial resolution","Three-dimensional displays","Principal component analysis","Distortion","Energy resolution","Remote sensing"
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2015 IEEE International
ISSN :
2153-6996
Electronic_ISBN :
2153-7003
Type :
conf
DOI :
10.1109/IGARSS.2015.7325834
Filename :
7325834
Link To Document :
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