An intercomparison of models for predicting bistatic scattering from rough surfaces

Author

Caglar Yardim;Joel T. Johnson;Robert J. Burkholder;Fernando L. Teixeira;Jeffrey D. Ouellette;Kun-Shan Chen;Marco Brogioni;Nazzareno Pierdicca

Author_Institution

ElectroScience Laboratory, Department of Electrical and Computer Engineering, Tho Ohio State University, Columbus, OH 43212 USA

fYear

2015

fDate

7/1/2015 12:00:00 AM

Firstpage

2759

Lastpage

2762

Abstract

This paper investigates the algorithms that are used to predict the full polarimetric bistatic normalized radar cross-section of rough surfaces. These include small perturbation method (SPM), the physical optics (PO) approach, the small slope approximation (SSA) and the integration equation method (IEM) and its derivatives improved IEM and advanced IEM. The methods are then compared to ground truth values obtained from multiple Monte Carlo runs a numerical Method of Moments (MOM) code using the same surface statistics. Effects of using band-limited exponential instead of a true exponential correlation function for surface statistics are also explored. Mean L₁-norm error values integrated over the hemisphere are given between AIEM and MOM and SSA and MOM.

Keywords

"Rough surfaces","Surface roughness","Method of moments","Scattering","Sea surface","Optical surface waves","Remote sensing"

Publisher

ieee

Conference_Titel

Geoscience and Remote Sensing Symposium (IGARSS), 2015 IEEE International

ISSN

2153-6996

Electronic_ISBN

2153-7003

Type

conf

DOI

10.1109/IGARSS.2015.7326385

Filename

7326385