• DocumentCode
    3691288
  • Title

    Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers

  • Author

    Yanqing Gao;Zhiming Huang;Yun Hou;Jing Wu;Wei Zhou;Cheng Ouyang;Junhao Chu

  • Author_Institution
    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai, 200083, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.
  • Keywords
    "Optical films","Optical refraction","Optical variables control","Optical detectors","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
  • ISSN
    2162-2027
  • Electronic_ISBN
    2162-2035
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2015.7327441
  • Filename
    7327441
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3691288