• DocumentCode
    3691314
  • Title

    Accurate material parameter extraction from broadband terahertz spectroscopy

  • Author

    N. R. Greenall;C. D. Wood;C. Russell;L. H. Li;E. H. Linfield;A. G. Davies;J. E. Cunningham;A. D. Burnett

  • Author_Institution
    School of Electronic and Electrical Engineering, University of Leeds, LS2 9JT, United Kingdom
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate how a transfer function model based parameter extraction method, combined with total variance analysis, allows the extraction of both the complex refractive index and the thickness of a sample over a bandwidth of >6 THz from THz time-domain spectroscopy measurements. We discuss how the techniques developed have been applied to absorbent powders measured at variable low temperatures.
  • Keywords
    "Temperature measurement","Thickness measurement","Spectroscopy","Bandwidth","Time-domain analysis","Silicon","Refractive index"
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
  • ISSN
    2162-2027
  • Electronic_ISBN
    2162-2035
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2015.7327467
  • Filename
    7327467
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3691314