• DocumentCode
    3691943
  • Title

    Optimization of probe capability using MPCps

  • Author

    Wiljelm Carl K. Olalia

  • Author_Institution
    ON Semiconductor Philippines Incorporated, Golden Mile Business Park SEZ, Governor´s Drive, Carmona, Cavite, 4116
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Based on the MPCpS, it has been concluded that Probe Damage Occurrence at Prober X using blade type needle are caused by Capability Limitation. Set-up constraint is the reason for Capability issue. Optimum Setting determined from Stage 4 has been immediately implemented. There is a Characterization made separately for checking of consequential effect since the contact during Probing is being decreased approximately 1 mil. Implementation of the change in over travel setting resulted to significant decrease in terms of Probe Damage ppm.
  • Keywords
    "Probes","Needles","Blades","Optimization","Current measurement","Joints","Business"
  • Publisher
    ieee
  • Conference_Titel
    Joint e-Manufacturing and Design Collaboration Symposium (eMDC) & 2015 International Symposium on Semiconductor Manufacturing (ISSM), 2015
  • Type

    conf

  • Filename
    7328903
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3691943