• DocumentCode
    3692357
  • Title

    Evaluation of acoustic properties of (K,Na)NbO3 film

  • Author

    Ryosuke Kaneko;Micho Kadota;Yuji Ohashi;Jun-ichi Kushibiki;Shinsuke Ikeuchi;Shuji Tanaka

  • Author_Institution
    Graduate school, Tohoku University, Sendai, Miyagi, Japan
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Currently, it is required to develop lead-free piezoelectric thin film materials such as (K,Na)NbO3 (KNN) for a substitute of Pb(Zr,Ti)O3 (PZT). However, the material constants of a KNN film have not been reported yet. In this paper, some material constants of a KNN film are presented for the first time. We fabricated some piezoelectric resonators using a blanket KNN film by MEMS (micro electro mechanical systems) technology, and obtained the following material constants and related values; s11E = 9.27 pm2/N, s12E = -3.06 pm2/N, s66E = 24.7 pm2/N, c33E = 2.89 GPa, k312 = 0.06%, kt2 = 2.08%, d31 = -78.9 pC/N, Poison ratio σE = 0.33, and e33T0 = 1.27×103. We also measured the velocities of leaky Lamb wave in a KNN diaphragm covered with Al using a line-focus-beam ultrasonic material characterization (LFB-UMC) system. Phase velocities of 1491 m/s and 5370-5180 m/s were measured for antisymmetric (A0) and symmetric (S0) modes of leaky Lamb wave, respectively. This is an important step to the determination of full material constants of the KNN film.
  • Keywords
    "Micromechanical devices","Magnetic films","Transducers","Silicon","Etching","Milling"
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2015 IEEE International
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2015.0139
  • Filename
    7329348