DocumentCode
3692892
Title
MM-wave noise measurements under nonlinear conditions
Author
J. Martens
Author_Institution
Anritsu Company, Morgan Hill CA 95037 US
fYear
2015
Firstpage
1
Lastpage
3
Abstract
Among a class of noise measurements of interest are those where a (pseudo-)deterministic drive is applied to a DUT and the noise power, in some spectral sub-region, or more generally, is measured. As higher power mm-wave applications proliferate, that measurement type becomes increasingly of interest at higher frequencies where wider bandwidth analyses are needed and the measurement sensitivity-linearity trade-off can be more challenging. A setup will be presented and exercised making these measurements up through the E- to D-band range with 200 MHz of instantaneous bandwidth and a noise sensitivity of -75 dBm absolute with a DUT output level of 10 dBm. Several DUT responses will be examined to study the noise distribution with power and signal type.
Keywords
"Noise measurement","Receivers","Power measurement","Radio frequency","Frequency measurement","Distortion measurement","Bandwidth"
Publisher
ieee
Conference_Titel
Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), 2015
Type
conf
DOI
10.1109/INMMIC.2015.7330347
Filename
7330347
Link To Document