DocumentCode
3695725
Title
Prediction of shunt malfunction of track circuit based on PSO-SVM
Author
Mengqi-Zhang; Huibing-Zhao
Author_Institution
Beijing Jiaotong University, China
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1783
Lastpage
1787
Abstract
Shunt malfunction of track circuit is the important factor that affects the efficiency and safety of railway transportation. In this paper, the influences to induced current which caused by shunt malfunction has been analyzed based on track circuit theoretical model and the wavelet decomposition and reconstruction algorithm was used to compare and analyze the detail component of the current both in the normal condition and shunt malfunction condition. The prediction accuracy rate can be as high as 99.5% with the prediction model.
Keywords
"Predictive models","Integrated circuit modeling","Support vector machines","Insulation life","Degradation","Accuracy","Wheels"
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2015 IEEE 10th Conference on
Type
conf
DOI
10.1109/ICIEA.2015.7334400
Filename
7334400
Link To Document