• DocumentCode
    3695725
  • Title

    Prediction of shunt malfunction of track circuit based on PSO-SVM

  • Author

    Mengqi-Zhang; Huibing-Zhao

  • Author_Institution
    Beijing Jiaotong University, China
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1783
  • Lastpage
    1787
  • Abstract
    Shunt malfunction of track circuit is the important factor that affects the efficiency and safety of railway transportation. In this paper, the influences to induced current which caused by shunt malfunction has been analyzed based on track circuit theoretical model and the wavelet decomposition and reconstruction algorithm was used to compare and analyze the detail component of the current both in the normal condition and shunt malfunction condition. The prediction accuracy rate can be as high as 99.5% with the prediction model.
  • Keywords
    "Predictive models","Integrated circuit modeling","Support vector machines","Insulation life","Degradation","Accuracy","Wheels"
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2015 IEEE 10th Conference on
  • Type

    conf

  • DOI
    10.1109/ICIEA.2015.7334400
  • Filename
    7334400