Title :
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters
Author :
Farokh Irom;Shri G. Agarwal
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol. Pasadena, Pasadena, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
This paper reports single-event latchup and total ionizing dose results for a variety of digital to analog converters targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.
Keywords :
"Conferences","Temperature measurement","Degradation","CMOS integrated circuits","Performance evaluation","BiCMOS integrated circuits","Propulsion"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336706
