• DocumentCode
    3697263
  • Title

    ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172

  • Author

    Kirby Kruckmeyer;Thang Trinh

  • Author_Institution
    Texas Instrum., Santa Clara, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Texas Instruments´ LM7171 (5962F9553602VXA) was tested to 300 krad and LM6172 (5962R9560403VXA) was tested to 200 krad at a dose rate of 10 mrad/s. Testing to 300 krad took one year. Both products were ELDRS free.
  • Keywords
    "Testing","Radiation effects","Gain","Feedback amplifiers","Pins","Distortion","Electronic mail"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336707
  • Filename
    7336707
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697263