DocumentCode :
3697324
Title :
Challenges of fulfilling the promise of tunnel FETs
Author :
S. Datta;R. Pandey
Author_Institution :
The Pennsylvania State University, University Park, PA 16802, USA
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
III-V Hetero-junction Tunnel FET (HTFET) are promising candidates for supply voltage scaling down to sub-0.5V due to their promise of sub-kT/q switching without compromising on-current (ION). Recently n-type III-V HTFET with reasonable ION and sub-kT/q switching at VDS=0.5V have been demonstrated [1]. However, steep switching performance of III-V HTFET till date has been limited to range of drain current (IDS) spanning over less than a decade. Here, we analyze primary roadblocks in the path towards achieving steep switching performance in III-V HTFET. Temperature dependent current-voltage measurements on III-V HTFET are performed and calibrated numerical simulations are used to quantify the metrics towards realizing sub-kT/q switching over large IDS range.
Keywords :
"Switches","Field effect transistors","Temperature dependence","Temperature measurement","Junctions","Logic gates","Integrated circuit modeling"
Publisher :
ieee
Conference_Titel :
Energy Efficient Electronic Systems (E3S), 2015 Fourth Berkeley Symposium on
Type :
conf
DOI :
10.1109/E3S.2015.7336799
Filename :
7336799
Link To Document :
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