Title :
Electrochemical migration of Ag in Na2SO4 environment
Author :
B?lint Medgyes;S?ndor ?d?m;B?la Szikora;L?szl? G?l;Patrik Tam?si
Author_Institution :
Department of Electronics Technology, Budapest University of Technology and Economics, Hungary
Abstract :
The effect of sulphate ion concentration on electrochemical migration (ECM) of silver was investigated by applying an in-situ optical and electrical inspection system. It was found that dendrites grow not only in an electrolyte solution with low sulphate ion concentration but also in electrolytes with medium and high or even saturated sulphate ion concentrations. According to the Mean-Time-To-Failure (MTTF) values, the migration susceptibility was decreased with the increase of sulphate ion concentration in case of low and medium concentration levels. However, the ECM susceptibility was increased at saturated concentration level.
Keywords :
"Electronic countermeasures","Silver","Voltage measurement","Ions","Cathodes","Crystals"
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2015 IEEE 21st International Symposium for
DOI :
10.1109/SIITME.2015.7342357
