A new method for measuring alias-free aperture jitter in an ADC output

This paper proposes a new method for directly measuring alias-free aperture jitter in an ADC output. Both the average ENOB and the worst-case ENOB due to aperture jitter are also measured after the elimination of the aliasing noise. Because it adds only a negligible computation time to an existing ENOB test of a single frequency, it can also be used in an HV production environment and should reduce the overall test time by at least three times.