• DocumentCode
    3701677
  • Title

    A new method for measuring alias-free aperture jitter in an ADC output

  • Author

    Takahiro J. Yamaguchi;Katsuhiko Degawa;Masayuki Kawabata;Masahiro Ishida;Kouichiro Uekusa;Mani Soma

  • Author_Institution
    Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a new method for directly measuring alias-free aperture jitter in an ADC output. Both the average ENOB and the worst-case ENOB due to aperture jitter are also measured after the elimination of the aliasing noise. Because it adds only a negligible computation time to an existing ENOB test of a single frequency, it can also be used in an HV production environment and should reduce the overall test time by at least three times.
  • Keywords
    "Jitter","Apertures","Noise measurement","Amplitude modulation","Frequency measurement","Signal to noise ratio","Clocks"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2015 IEEE International
  • Type

    conf

  • DOI
    10.1109/TEST.2015.7342384
  • Filename
    7342384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3701677