• DocumentCode
    3703793
  • Title

    Electrical and thermal characterization of single and multi-finger InP DHBTs

  • Author

    V. Midili;V. Nodjiadjim;Tom K. Johansen;M. Riet;J.Y. Dupuy;A. Konczykowska;M. Squartecchia

  • Author_Institution
    Department of Electrical Engineering, Technical University of Denmark, 2800 Kgs. Lyngby, Denmark
  • fYear
    2015
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    This paper presents the characterization of single and multi-finger Indium Phosphide Double Heterojunction Bipolar transistors (InP DHBTs). It is used as the starting point for technology optimization. Safe Operating Area (SOA) and small signal AC parameters are investigated along with thermal characteristics. The results are presented comparing different device dimensions and number of fingers. This work gives directions towards further optimization of geometrical parameters and reduction of thermal effects.
  • Keywords
    "Current measurement","Integrated circuits","Double heterojunction bipolar transistors","Thermal resistance","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference (EuMIC), 2015 10th European
  • Type

    conf

  • DOI
    10.1109/EuMIC.2015.7345090
  • Filename
    7345090
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3703793