DocumentCode :
3703795
Title :
Broadband low-noise GaN HEMT TWAs using an active distributed drain bias circuit
Author :
Friedbert van Raay;R?diger Quay;Beatriz Aja;Giuseppe Moschetti;Matthias Seelmann-Eggebert;Michael Schlechtweg;Oliver Ambacher
Author_Institution :
Fraunhofer Institute of Applied Solid-State Physics (IAF), Tullastr. 72, D-79108 Freiburg, Germany
fYear :
2015
Firstpage :
156
Lastpage :
159
Abstract :
Modern communication and radar systems show an increasing demand for robust ultra-broadband amplifiers for low-noise applications. A set of three different 0.5 GHz to 20 GHz MMIC LNAs using a GaN HEMT technology with a gate length of 0.25 μm was designed and fabricated, each with a noise figure between 3 dB and 7 dB over frequency. Two designs with four and five FET cells feature approx. 10 dB and 11 dB broadband gain, while a third MMIC with a chain connection of both figures more than 20 dB of gain. A distributed active drain bias circuit substitutes large area or off-chip inductor structures and enables a full-MMIC chain connection of both TWA stages.
Keywords :
"Logic gates","Gain","Capacitance","Broadband communication","HEMTs","Power transmission lines"
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2015 10th European
Type :
conf
DOI :
10.1109/EuMIC.2015.7345092
Filename :
7345092
Link To Document :
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