DocumentCode :
3705457
Title :
Efficient methodology for modeling structure of high-speed long transmission lines
Author :
Tiejun Yu;Jian Chen;Chiawen Shih
Author_Institution :
Sigrity R&
fYear :
2015
Firstpage :
113
Lastpage :
116
Abstract :
A practical approach for accurately modeling high-speed link structures is presented and named as the “cut and stitch” (C&S) methodology. To generate S-parameters for the whole system, C&S first cuts the structure into different parts with different electromagnetic (EM) features and also provides auto-generated ports at the cutting interfaces to do system connection later, then selects the proper EM solver for individual design partition´s modeling, and finally automatically stitches all of the S-parameter models together. Numerical experiments show that the approach can achieve more than one order of the speedup ratio with the acceptable accuracy.
Keywords :
"Three-dimensional displays","Numerical models","Scattering parameters","Solid modeling","Ports (Computers)","Electromagnetics","Finite element analysis"
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
Print_ISBN :
978-1-5090-0038-8
Type :
conf
DOI :
10.1109/EPEPS.2015.7347142
Filename :
7347142
Link To Document :
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