Channel detection in microscope images of materials using marked point process modeling

In this paper, using the Marked Point Process (MPP) framework, we propose a new model and method to detect channels in microscope images of materials. The detected channel configuration information is expected to be useful for analyzing materials images in many ways. As one example of the possible usage of this channel information, we propose a method to reduce bridging channel defects in the segmentation of images containing channels. Our experimental results demonstrate that proposed model and methods works effectively for both detecting channels and aiding segmentation.