DocumentCode :
3710747
Title :
Degradation phenomenon of electrical contacts by using a micro-sliding mechanism
Author :
Shin-ichi Wada;Koichiro Sawa
Author_Institution :
RD Dept., TMC Syst. Co. Ltd., Kawasaki, Japan
fYear :
2015
Firstpage :
241
Lastpage :
249
Abstract :
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mech-anism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed the third mechanism, namely another micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on the sliding, and smaller sized system constituted of commercial parts.
Keywords :
"Force","Actuators","Degradation","Transient analysis","Contact resistance","Oscillators"
Publisher :
ieee
Conference_Titel :
Electrical Contacts (Holm), 2015 IEEE 61st Holm Conference on
Type :
conf
DOI :
10.1109/HOLM.2015.7355104
Filename :
7355104
Link To Document :
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