DocumentCode
3710949
Title
Predicting the long term power loss from cell cracks in PV modules
Author
Vivek Gade;Narendra Shiradkar;Marco Paggi;Jared Opalewski
Author_Institution
Jabil Circuit Inc., 2007 Gandy Blvd, Suite 100, St. Petersburg, FL 33702, USA
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
6
Abstract
Long term power loss due to cell cracks can become a significant PV wear out mechanism. An experimental framework to assist in predicting the power loss from cell cracks during module service life is presented. The paper is primarily structured around cell crack origin in laminated modules, crack orientation, oriented crack reproduction and climatic testing of custom mini-modules. The results are experimentally verified by a series of accelerated tests involving mechanical load and humidity freeze tests. Periodic characterization using EL and flash I-V are used to study evolution of crack types/categories and performance loss due to cell cracks. Manufacturing modules cell crack data was collected from a population of a week of data post lamination. The data analyzed is for a certain batch of polycrystalline cell modules. Jabil has produced few GW of modules over the past years.
Keywords
"Hafnium","Reliability","Life estimation"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7355665
Filename
7355665
Link To Document