• DocumentCode
    3710949
  • Title

    Predicting the long term power loss from cell cracks in PV modules

  • Author

    Vivek Gade;Narendra Shiradkar;Marco Paggi;Jared Opalewski

  • Author_Institution
    Jabil Circuit Inc., 2007 Gandy Blvd, Suite 100, St. Petersburg, FL 33702, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Long term power loss due to cell cracks can become a significant PV wear out mechanism. An experimental framework to assist in predicting the power loss from cell cracks during module service life is presented. The paper is primarily structured around cell crack origin in laminated modules, crack orientation, oriented crack reproduction and climatic testing of custom mini-modules. The results are experimentally verified by a series of accelerated tests involving mechanical load and humidity freeze tests. Periodic characterization using EL and flash I-V are used to study evolution of crack types/categories and performance loss due to cell cracks. Manufacturing modules cell crack data was collected from a population of a week of data post lamination. The data analyzed is for a certain batch of polycrystalline cell modules. Jabil has produced few GW of modules over the past years.
  • Keywords
    "Hafnium","Reliability","Life estimation"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355665
  • Filename
    7355665