DocumentCode :
3711661
Title :
Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells
Author :
Andreas Vetter;Bernhard Hofbeck;Peter Kubis;Christoph J. Brabec
Author_Institution :
ZAE Bayern (Bavarian Center of Applied Energy Research), 91058 Erlangen, Germany
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
3
Abstract :
Imaging methods are an essential tool for improving processing of solar cells. Unfortunately, it is difficult to validate the imaging methods in detail. One focus of our work was to establish an approach by which one can assess the accuracy of the determination of the influence of defects via imaging on CIGS solar cells. The method is, however, not restricted to CIGS and should be easily transferable to other solar cell types, in particular other thin film technologies. The benefit of such a method is the possibility to validate and optimize imaging techniques and, in turn, improving tools to optimize solar cell material and processing of solar cells.
Keywords :
"Photovoltaic cells","Measurement by laser beam","Laser beams","Luminescence","Computers","Cameras"
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type :
conf
DOI :
10.1109/PVSC.2015.7356385
Filename :
7356385
Link To Document :
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