DocumentCode :
3711773
Title :
Reducing the cost of test for high-speed serial buses with COTS FPGA technology
Author :
Chris Nunn
Author_Institution :
High Speed Serial Test, National Instruments, Austin, TX, United States of America
fYear :
2015
Firstpage :
288
Lastpage :
290
Abstract :
Technology is trending towards more data, faster rates, smaller size, and less power. Better performance with a reduced footprint is hard to accomplish, but about 10 years ago, engineers solved this challenge for data movement by moving to a different digital communication paradigm. Instead of the traditional parallel buses that transmit clock and data separately, high-speed serial technology emerged that allows transmission of encoded data without the need for a separate clock signal. This has allowed industry to break the 1-2 GHz practical limit inherent to parallel busses and reach speeds over 50 GHz.
Keywords :
"Field programmable gate arrays","Protocols","Oscilloscopes","Test equipment","Physical layer"
Publisher :
ieee
Conference_Titel :
IEEE AUTOTESTCON, 2015
Type :
conf
DOI :
10.1109/AUTEST.2015.7356505
Filename :
7356505
Link To Document :
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