Title :
Common BIT test station agile development approach
Author :
W. Tod Newman;Gerald Emmert
Author_Institution :
Systems Design and Performance Directorate, Raytheon Missile Systems, Tucson, AZ, United States of America
Abstract :
Raytheon Tucson has multiple products that are designed to utilize Built-In Test (BIT) as the primary Unit Under Test (UUT) test approach. In order to perform BIT on many of Raytheon´s products a minimal amount of Test Equipment is required to provide power and communicate to the UUT. During 2012 a need arose for a common piece of test equipment which could replace the BIT test equipment used by multiple programs in a new, multi-program factory. This abstract and the resultant paper outlines the unique agile product development process used to design this new test system where the requirements from these multiple programs were gathered, consolidated, and ranked into a common specification that allowed for the development and deployment of a Common BIT test station that is in use at Raytheon.
Keywords :
"Production facilities","Product development","Test equipment","Missiles","Computer architecture","Delays"
Conference_Titel :
IEEE AUTOTESTCON, 2015
DOI :
10.1109/AUTEST.2015.7356521