• DocumentCode
    3718285
  • Title

    Thermal performance evaluation of Power QFN package with stacked and side by side die configuration

  • Author

    Cheong Chiang Ng

  • Author_Institution
    Freescale Semiconductor Malaysia Sdn. Bhd., 2 Jalan SS 8/2, FIZ Sungei Way, 47300 P.J., Selangor, Malaysia
  • fYear
    2015
  • Firstpage
    184
  • Lastpage
    187
  • Abstract
    Currently available Quad Flat No-lead package with 8 mils thick die pad, fails to meet the high power dissipation requirements of automotive, industrial, and commercial applications. The use of 20 mils thick die pad and heavy gauge aluminum bond wires in the Power Quad Flat No-lead package helps transfer heat from package while providing low electrical resistance. Side by side die configuration limits the capability to reduce the package size. A stacked die configuration eliminates the extra space for control die and flag. Thermal performance of both configurations was evaluated by using simulation tool under three different conditions, i.e. JEDEC thermal resistance measure for steady state operating condition, thermal impedance for transient switching operating condition, and thermal interaction of multiple independent heat sources in the package.
  • Keywords
    "Junctions","Thermal resistance","Power dissipation","Heating","Lead","Impedance"
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
  • Print_ISBN
    978-1-4673-9690-5
  • Type

    conf

  • DOI
    10.1109/IMPACT.2015.7365173
  • Filename
    7365173