DocumentCode :
3718363
Title :
Lifetime prediction of the epoxy resin adhesive under the optical performance degradation process
Author :
Ching-Yu Chen; Rong-Fong Wu; Chun-Ying Huang; Kuan-Jung Chung
Author_Institution :
Graduate Institute of Photonics, National Changhua University of Education, 500,Taiwan
fYear :
2015
Firstpage :
213
Lastpage :
216
Abstract :
In this study, an epoxy resin adhesive called optically clear resin (OCR) was prepared. The type I (time censored) accelerated degradation tests associated with various temperature-humidity conditions were performed to evaluate the lifetimes of the test vehicle. The optical performance, Yellow index (YI), was used and the failure criterion was defined when the YI reaches a specific value of 2. The test results indicate that the degradation path of test samples represent the brownian motion so that a Weiner process was applied to model the degradation of test samples. A typical Monde Carlo simulation was performed to predict the lifetimes at the threshold level for each test condition. The simulation results present that the lifetimes at the test condition 85°C/85% RH and 75°C/85% RH are 2216 hours and 3322 hours respectively. As the results, the acceleration factor and activation energy was calculated to be 1.5 and 0.6874 ev/K respectively. Furthermore, a bogey test method was used to determine the sample size and failure free test duration according to the specific reliability goal and confidence level.
Keywords :
"Optical character recognition software","Degradation","Humidity","Life estimation","Indexes","Reliability","Temperature"
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
Print_ISBN :
978-1-4673-9690-5
Type :
conf
DOI :
10.1109/IMPACT.2015.7365251
Filename :
7365251
Link To Document :
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